[Free download] Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
♥ Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis ♥
| 2016-11-30 | Original language:English | PDF # 1 | 9.21 x.38 x6.14l, | File Name: 3319488988 | 118 pages
||From the Back Cover|This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The au
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime ...
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