||From the Back Cover||This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.
The aim of the techniques and met...
[PDF.ut24] High Quality Test Pattern Generation and Boolean Satisfiability Rating: 3.79 (662 Votes)
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You can specify the type of files you want, for your device.High Quality Test Pattern Generation and Boolean Satisfiability | Stephan Eggersglüß, Rolf Drechsler. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.
