(Free download) Design-For-Test For Digital IC's and Embedded Core Systems
❀ Alfred Crouch ❀
| #2381781 in Books | 1999-07-02 | Original language:English | PDF # 1 | 9.00 x1.00 x6.90l,1.33 | File Name: 0130848271 | 347 pages
||2 of 2 people found the following review helpful.| Great topics but detail is missing|By Edward T. Kerns|The topics covered in the book were great, but there was not enough detail present. The book is written for readers familiar with design, and sometimes assumes test knowledge as well. The text seemed to be repetative and full page, low detail diagrams were repeated quite frequently. I was disappointed that several pages|From the Inside Flap|Preface|This book is made primarily for design engineers and managers, and for test and design-for-test engineers and managers. It can also be used for students of digital design and test, as well. The purpose of this book is to introduce t
Provides testing strategies that address business needs for quality, reliability, and cost control. This book helps to optimize the engineering trade-offs between resources such as silicon area, operating frequency, and power consumption. Focusing on automatic test pattern generation (ATPG), it is for the engineers involved in design and testing.
[PDF.ly51] Design-For-Test For Digital IC's and Embedded Core Systems Rating: 3.88 (522 Votes)
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