[Read free] Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)
▲ Charles Chiang, Jamil Kawa ▲
| #13925073 in Books | 2010-11-23 | Original language:English | PDF # 1 | 9.25 x.65 x6.10l,.90 | File Name: 9048173035 | 255 pages
||0 of 0 people found the following review helpful.| Too simplistic!|By Mann|This is a very simplistic book and probably not fit for publication. It comes across like a collection of marketing notes and slides hastily prepared with not much depth. After reviewing the book I realized I can find more in depth description of topics related to design for manufacturing and yield from searching the internet for free!|2 of 4 people fo
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
[PDF.da32] Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems) Rating: 4.65 (703 Votes)
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You can specify the type of files you want, for your device.Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems) | Charles Chiang, Jamil Kawa. I was recommended this book by a dear friend of mine.
